A 32 x 128 SPAD-257 TDC Receiver IC for Pulsed TOF Solid-State 3-D Imaging

A single-chip receiver for pulsed laser direct time-of-flight 3-D imaging applications has been realized in a 0.35-μm HV CMOS technology. The chip includes a 32 x 128 single-photon avalanche diode (SPAD) array [35% fill factor (FF)] and 257 time-to-digital converters (TDCs) with a ~78-ps resolution. Two adjacent rows (2 x 128 SPADs) at a time can be selected for simultaneous measurement, i.e., 16 measurement cycles are needed to cover the whole array. SPADs are capable of operating in a gated mode in order to suppress dark and background light-induced detections. The IC was designed to be used in a solid-state 3-D imaging system with laser illumination concentrated in both time (short sub-ns pulses) and space (targeting only the active rows of the SPAD array). The performance of the receiver IC was characterized in a solid-state 3-D range imager with flood-pulsed illumination from a laser diode (LD)-based transmitter, which produced short [~150-ps full-width at half-maximum (FWHM)] high-energy (~3.8-nJ pulse/~14-W peak power) pulses at a pulsing rate of 250 kHz when operating at a wavelength of 810 nm. Two detector/TDC ICs formed an 8k pixel receiver, targeting a field-of-view of ~42° x 21° by means of simple optics. Frame rates of up to 20 fps were demonstrated with a centimeter-level precision in the case of Lambertian targets within a range of 3.5 m.

Authors:
Jahromi Sahba, Jansson Jussi-Pekka, Keränen Pekka, Kostamovaara Juha

Publication type:
A1 Journal article – refereed

Place of publication:

Keywords:
3-D imager, CMOS, direct time-of-flight (dTOF), single-photon avalanche diode (SPAD), solid state, time gating, Time-to-digital converter (TDC)

Published:

Full citation:
S. Jahromi, J. Jansson, P. Keränen and J. Kostamovaara, “A 32 × 128 SPAD-257 TDC Receiver IC for Pulsed TOF Solid-State 3-D Imaging,” in IEEE Journal of Solid-State Circuits, vol. 55, no. 7, pp. 1960-1970, July 2020, doi: 10.1109/JSSC.2020.2970704

DOI:
https://doi.org/10.1109/JSSC.2020.2970704

Read the publication here:
http://urn.fi/urn:nbn:fi-fe2020050825689